FO+

Hier finden Sie die aktuellen Veröffentlichungen der Bündnispartner zum Thema ›Freiformoptik‹ 

asphericon GmbH

  • Freeform capability enabled by ISO 10110 Proc. SPIE 9582, Optical System Alignment, Tolerancing, and Verification IX, 958202 (3 September 2015); doi: 10.1117/12.2188160
    Sven R. Kiontke; David M. Aikens; Richard N. Youngworth
  • Monolithic freeform element Proc. SPIE 9575, Optical Manufacturing and Testing XI, 95750G (25 September 2015); doi: 10.1117/12.2188138
    Sven R. Kiontke

  • Implementing ISO standard-compliant freeform component drawings; Opt. Eng. 55(7), 071205 (Apr 07, 2016); doi:10.1117/1.OE.55.7.071205
    Sven R. Kiontke; David M. Aikens; Richard N. Youngworth


Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF

  • Tutorial: Freeform Metal Optics-International Conference on Space Optics, Tenerife / Spain (2014)
    Gebhardt, Hartung, Kinast
  • Proc. ICSO - International Conference on Space Optics (2014); Dimensional  stability of metal optics on nickel plated AlSi40
    Kinast, Grabowski, Gebhardt, Rohloff, Rochau, Risse, Tünnermann
  • EUSPEN Freeform Group, Padova / Italy (2014); Poster: Structured freeforms challenge manufacturing technologies
    Steinkopf, Gebhardt, Risse, Eberhardt
  • EPIC Workshop on Freeform Optics, Copenhagen / Denmark (2015); Diamond machining of freeform optics
    Steinkopf, Gebhardt, Risse, Eberhardt
  • 7. High-Level-Expert-Meeting CC UPOB - Asphere Metrology, Brauschweig (2015); Measuring position and figure deviation with Computer Generated Holograms
    Beier, Stumpf, Gebhardt, Risse, Zeitner
  • Applied Optics 54/16, in print (2015); Development, fabrication, and testing of an anamorphic imaging snap-together freeform telescope
    Beier, Hartung, Peschel, Damm, Gebhardt, Scheiding, Stumpf, Zeitner, Risse, Eberhardt, Tünnermann
  • Proc. EOSMTOC, accepted (2015); Ultra-precise manufacturing of aspherical mirrors based on a freeform technology for applications in the VIS spectral range
    Risse, Beier, Hartung, Gebhardt, Eberhardt

 

Institut für Angewandte Physik der FSU Jena

  • FSU-IAP Jahresbericht (2014); Neuartige Beschreibungen optischer Freiformflächen
    Brömel, Gross, Oleszko, Hartung, Lippmann
  • Journal of Applied Physics 116, 173503-173512 (2014); The structural and optical properties of black silicon by inductively coupled plasma reactive ion etching
    Steglich, Käsebier, Zilk, Pertsch, Kley, Tünnermann
  • Infrared Physics & Technology 69, 218-221 (2015); Self-organized, effective medium Black Silicon for infrared antireflection
    Steglich, Käsebier, Schrempel, Kley, Tünnermann
  • Proc. SPIE 9372, High Contrast Metastructures IV (2015); Bringing mirrors to rest: grating concepts for ultra-precise interferometry
    Kroker, Kley, Tünnermann
  • SPIE Photonics West 9372-25 (2015); Tailoring the angular transmission behavior of high-contrast gratings
    Kroker, Käsebier, Kley, Tünnermann

 

JENOPTIK Optical Systems GmbH

  • OSA Imaging and Applied Optics, Arlington / USA (2015); Describing freeform surfaces with orthogonal functions
    Ochse

  • Predicting polarization performance of high-numerical aperture inspection
    Fahr

  • Tolerancing the impact of mid-spatial frequency surface errors of lenses in distortion and image homogeneity
    Uhlendorf

  • Describing freeform surfaces with orthogonal function
    Ochse

Optics Balzers Jena GmbH

  • Proc. SPIE 9241, Sensors, Systems, and Next-Generation Satellites XVIII (2014); Bandpass filter arrays patterned by photolithography for multi-spectral remote sensing
    Bauer, Thome, Eisenhammer
  • 10. Thementage Grenz- und Oberflächentechnik, 4. Koll. Dünne Schichten in der Optik, Leipzig (2014);  Herstellung von Filterarrays zur multispektralen Beobachtung
    Kessler, Bauer
    • Proceedings of SPIE Volume 9627, Optical Systems Design 2015: Advances in Optical Thin Films V, Page 962710-1 - 962710-9 (September 23, 2015); "Low scattering filter coatings made by plasma-assisted reactive magnetron sputtering"
      Jan Broßmann, Marc Lappschies, Stefan Jakobs, Volker Kirschner

     

    VITRON Spezialwerkstoffe GmbH

    • Glasbibliothek: VITRON Chalkogenid-Gläser für „CODE V“ opt. Design-Programm, VITRON Chalkogenid-Gläser für Zemax
    • Optische Parameter - Index, Transmission: VITRON Chalkogenid-Glass IG2; VITRON Chalkogenid-Glass IG3; VITRON Chalkogenid-Glass IG4; VITRON Chalkogenid-Glass IG5; VITRON Chalkogenid-Glass IG6
    • 3rd International WORKshop on Infrared Technologies
      Henkel

     

     

    • Investigation of TMA systems with different freeform surfaces Paper 9626-28
      Yi Zhong, Friedrich-Schiller-Univ.
      Jena (Germany); Herbert Gross, Friedrich-Schiller-Univ. Jena (Germany), Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany); Anika Broemel, Friedrich-Schiller-Univ. Jena (Germany); Steffen Kirschstein, Paul Petruck, Jena-Optronik GmbH (Germany); Andreas Tünnermann, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany), Friedrich-Schiller-Univ. Jena (Germany)